Optical scattering measurement and analysis

• Main Author: Stover, John C.
• Corporate Author: Society of Photo-optical Instrumentation Engineers.
• Format: eBook
• Language: English
• Published: Bellingham, Wash., USA : SPIE Optical Engineering Press, c1995.
• Edition: 2nd ed.
• Series: SPIE monograph ; PM24.
• Subjects: Light > Scattering.; elektronické knihy; electronic books
• ISBN: 9781615837397; 9780819419347; 9780819478443; 9780819477767
• Physical Description: 1 online zdroj (xiii, 321 p.) : ill.
• Access: Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity

As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable.