Optical scattering measurement and analysis
As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentat...
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| Main Author | |
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| Corporate Author | |
| Format | Electronic eBook |
| Language | English |
| Published |
Bellingham, Wash., USA :
SPIE Optical Engineering Press,
c1995.
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| Edition | 2nd ed. |
| Series | SPIE monograph ;
PM24. |
| Subjects | |
| Online Access | Full text |
| ISBN | 9781615837397 9780819419347 9780819478443 9780819477767 |
| Physical Description | 1 online zdroj (xiii, 321 p.) : ill. |
Cover
| Summary: | As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable. |
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| Bibliography: | Includes bibliographical references (p. 303-317) and index. |
| ISBN: | 9781615837397 9780819419347 9780819478443 9780819477767 |
| Access: | Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity |
| Physical Description: | 1 online zdroj (xiii, 321 p.) : ill. |