ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA

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Bibliographic Details
Corporate Author: International Symposium for Testing and Failure Analysis Houston, Tex.)
Format: eBook
Language: English
Published: Materials Park, Ohio : ASM International, 2014.
Subjects:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
elektronické knihy
electronic books
ISBN: 9781627080750
9781680155143
9781627080743
Physical Description: 1 online zdroj (560 pages) : color illustrations, photographs.

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Table of contents

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001 81481
003 CZ ZlUTB
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006 m o d
007 cr |n
008 150109t20142014ohuao s 001 0 eng d
020 |a 9781627080750  |q (ebook) 
020 |a 9781680155143  |q (ebook) 
020 |z 9781627080743 
035 |a (OCoLC)900889018 
040 |a E7B  |b eng  |e rda  |c E7B  |d OCLCO  |d YDXCP  |d KNOVL  |d OCLCO  |d OCLCF  |d OCLCO 
111 2 |a International Symposium for Testing and Failure Analysis  |n (40th :  |d 2014 :  |c Houston, Tex.) 
245 1 0 |a ISTFA 2014 :  |b conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /  |c organized by Electronic Device Failure Analysis Society, ASM International. 
264 1 |a Materials Park, Ohio :  |b ASM International,  |c 2014. 
264 4 |c ©2014 
300 |a 1 online zdroj (560 pages) :  |b color illustrations, photographs. 
336 |a text  |b txt  |2 rdacontent 
337 |a počítač  |b c  |2 rdamedia 
338 |a online zdroj  |b cr  |2 rdacarrier 
500 |a Includes index. 
590 |a Knovel Library  |b ACADEMIC - Metals & Metallurgy 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity 
650 0 |a Electronics  |x Materials  |x Testing  |v Congresses. 
650 0 |a Electronic apparatus and appliances  |x Testing  |v Congresses. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
710 2 |a Electronic Device Failure Analysis Society,  |e organizer. 
710 2 |a ASM International,  |e organizer. 
776 0 8 |i Print version:  |a International Symposium for Testing and Failure Analysis (40th : 2014 : Houston, Tex.)  |t ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA.  |d Materials Park, Ohio : ASM International, c2014  |h xx, 540 pages  |z 9781627080743 
856 4 0 |u https://proxy.k.utb.cz/login?url=http://app.knovel.com/web/toc.v/cid:kpISTFAC31  |y Plný text 
992 |a BK  |c KNOVEL 
999 |c 81481  |d 81481 
993 |x NEPOSILAT  |y EIZ 

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