Value analysis tear-down a new process for product development and innovation

• Main Author: Sato, Yoshihiko
• Other Authors: Kaufman, J. Jerry
• Format: Electronic eBook
• Language: English
• Published: New York : Industrial Press : Society of Manufacturing Engineers, 2005.
• Edition: 1st ed.
• Subjects: Value analysis (Cost control); Industrial productivity.; New products.; Engineering economy.; elektronické knihy; electronic books
• ISBN: 9781615835799; 9780831132033
• Physical Description: 1 online zdroj (x, 206 p.) : ill.

Table of Contents:

• Ch. 1. VA tear-down : what it is, how it developed
• Ch. 2. Value analysis and VA tear-down
• Ch. 3. The VA tear-down process
• Ch. 4. Applying VA tear-down to issues of concern
• Ch. 5. Evaluating VA tear-down results
• Ch. 6. Other measures of competitiveness with VA tear-down.