Microelectronics failure analysis desk reference

• Corporate Authors: ASM International, Electronic Device Failure Analysis Society
• Other Authors: Ross, Richard J.
• Format: eBook
• Language: English
• Published: Materials Park, Ohio : ASM International, c2011.
• Edition: 6th ed.
• Subjects: Microelectronics > Materials > Testing > Handbooks, manuals, etc.; Microelectronics > Defects > Testing > Handbooks, manuals, etc.; Electronic apparatus and appliances > Testing > Handbooks, manuals, etc.; Electronics > Materials > Testing > Handbooks, manuals, etc.; Electronics > Materials > Defects > Handbooks, manuals, etc.; elektronické knihy; electronic books
• ISBN: 9781613447598; 9781615037261; 9781615037254
• Physical Description: 1 online zdroj (xi, 660 p.) : ill.

Table of Contents:

• Section 1. Introduction
• section 2. Failure analysis process overviews
• section 3. Failure analysis topics
• section 4. Fault verification and classification
• section 5. Localization techniques
• section 6. Deprocessing and sample preparation
• section 7. Inspection
• section 8. Materials analysis
• section 9. Focused ion beam applications
• section 10. Management and reference information.