Microelectronics failure analysis desk reference

• Corporate Authors: ASM International., Electronic Device Failure Analysis Society.
• Other Authors: Ross, Richard J.
• Format: eBook
• Language: English
• Published: Materials Park, Ohio : ASM International, c2011.
• Edition: 6th ed.
• Subjects: Microelectronics > Materials > Testing > Handbooks, manuals, etc.; Microelectronics > Defects > Testing > Handbooks, manuals, etc.; Electronic apparatus and appliances > Testing > Handbooks, manuals, etc.; Electronics > Materials > Testing > Handbooks, manuals, etc.; Electronics > Materials > Defects > Handbooks, manuals, etc.; elektronické knihy; electronic books
• ISBN: 9781613447598; 9781615037261; 9781615037254
• Physical Description: 1 online zdroj (xi, 660 p.) : ill.
• Item Description: "ASM International, 2011, no. 09110Z"--P. 4 of cover.; Some online versions lack accompanying media packaged with the printed version.
• Access: Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity