Microelectronics failure analysis desk reference

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Bibliographic Details
Corporate Authors ASM International, Electronic Device Failure Analysis Society
Other Authors Ross, Richard J.
Format eBook
LanguageEnglish
Published Materials Park, Ohio : ASM International, c2011.
Edition6th ed.
Subjects
Microelectronics > Materials > Testing > Handbooks, manuals, etc.
Microelectronics > Defects > Testing > Handbooks, manuals, etc.
Electronic apparatus and appliances > Testing > Handbooks, manuals, etc.
Electronics > Materials > Testing > Handbooks, manuals, etc.
Electronics > Materials > Defects > Handbooks, manuals, etc.
elektronické knihy
electronic books
Online AccessFull text
ISBN9781613447598
9781615037261
9781615037254
Physical Description1 online zdroj (xi, 660 p.) : ill.

Cover

TOC from ObalkyKnih.cz
More Information
Item Description:"ASM International, 2011, no. 09110Z"--P. 4 of cover.
Some online versions lack accompanying media packaged with the printed version.
Bibliography:Includes bibliographical references and indexes.
ISBN:9781613447598
9781615037261
9781615037254
Access:Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity
Physical Description:1 online zdroj (xi, 660 p.) : ill.

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