Design and test technology for dependable systems-on-chip

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Bibliographic Details
Corporate Author IGI Global
Other Authors Ubar, Raimund, 1941-, Raik, Jaan, 1972-, Vierhaus, Heinrich Theodor, 1951-
Format eBook
LanguageEnglish
Published Hershey, Pa. : IGI Global (701 E. Chocolate Avenue, Hershey, Pennsylvania, 17033, USA), c2011.
Subjects
Online AccessFull text
ISBN9781609602147
9781609602123
Physical Description1 online zdroj (1 v.)
Also available in print.

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Abstract:Covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC).
Bibliography:Includes bibliographical references.
ISBN:9781609602147
9781609602123
Access:Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity
Physical Description:1 online zdroj (1 v.)
Also available in print.