Extended defects in semiconductors electronic properties, device effects and structures

"This book surveys the properties, effects, roles and characterization of structurally extended defects in semiconductors. The basic properties of extended defects are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices and techniques f...

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Bibliographic Details
Main Author: Holt, D. B.
Other Authors: Yacobi, B. G.
Format: eBook
Language: English
Published: Cambridge ; New York : Cambridge University Press, 2007.
Subjects:
Semiconductors > Defects.
elektronické knihy
electronic books
ISBN: 9780511276880
9780511279287
9780521819343
9780511278686
Physical Description: 1 online zdroj (xi, 631 p.) : ill.

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LEADER 02686cam a2200385 a 4500
001 78982
003 CZ ZlUTB
005 20240911214716.0
006 m o d
007 cr |n
008 110215s2007 enka sb 001 0 eng d
020 |a 9780511276880  |q (ebook) 
020 |a 9780511279287  |q (ebook) 
020 |a 9780521819343 
020 |a 9780511278686  |q (ebook) 
035 |a (OCoLC)701832671  |z (OCoLC)169906912  |z (OCoLC)213380347  |z (OCoLC)648213511 
040 |a KNOVL  |b eng  |c KNOVL  |d OCLCQ  |d DEBSZ  |d OCLCQ  |d N$T  |d YDXCP  |d UAB  |d E7B  |d IDEBK  |d OCLCQ  |d KNOVL  |d ZCU  |d KNOVL  |d OCLCF  |d KNOVL 
100 1 |a Holt, D. B. 
245 1 0 |a Extended defects in semiconductors  |h [elektronický zdroj] :  |b electronic properties, device effects and structures /  |c D.B. Holt, B.G. Yacobi. 
260 |a Cambridge ;  |a New York :  |b Cambridge University Press,  |c 2007. 
300 |a 1 online zdroj (xi, 631 p.) :  |b ill. 
504 |a Includes bibliographical references and index. 
505 0 |a 1. Semiconducting materials; 2. An introduction to extended defects; 3. Characterization of extended defects in semiconductors; 4. Core structures and mechanical effects of extended defects specific to semiconductors; 5. The electrical, optical and device effects of dislocations and grain boundaries; 6. Point defect materials problems. 
520 1 |a "This book surveys the properties, effects, roles and characterization of structurally extended defects in semiconductors. The basic properties of extended defects are outlined, and their effect on the electronic properties of semiconductors, their role in semiconductor devices and techniques for their characterization are discussed. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics."--Jacket. 
590 |a Knovel Library  |b ACADEMIC - Electronics & Semiconductors 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity 
650 0 |a Semiconductors  |x Defects. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
700 1 |a Yacobi, B. G. 
776 0 8 |i Print version:  |a Holt, D.B.  |t Extended defects in semiconductors.  |d Cambridge ; New York : Cambridge University Press, 2007  |z 9780521819343  |w (DLC) 2006037298  |w (OCoLC)76167306 
856 4 0 |u https://proxy.k.utb.cz/login?url=http://app.knovel.com/hotlink/toc/id:kpEDSEPDE1/extended_defects_in_semiconductors__electronic_properties_device_effects_and_structures  |y Plný text 
992 |a BK  |c KNOVEL 
999 |c 78982  |d 78982 
993 |x NEPOSILAT  |y EIZ 

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