Encyclopedia of materials characterization surfaces, interfaces, thin films
Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials scie...
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| Other Authors | , , |
|---|---|
| Format | Electronic eBook |
| Language | English |
| Published |
Boston : Greenwich, CT :
Butterworth-Heinemann ; Manning,
c1992.
|
| Series | Materials characterization series.
|
| Subjects | |
| Online Access | Full text |
| ISBN | 9781591245025 9780080523606 9780750691680 |
| Physical Description | 1 online zdroj (xix, 751 p.) : ill. |
Cover
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| 245 | 0 | 0 | |a Encyclopedia of materials characterization |h [elektronický zdroj] : |b surfaces, interfaces, thin films / |c editors, C. Richard Brundle, Charles A. Evans, Jr., Shaun Wilson ; managing editor, Lee E. Fitzpatrick. |
| 260 | |a Boston : |b Butterworth-Heinemann ; |a Greenwich, CT : |b Manning, |c c1992. | ||
| 300 | |a 1 online zdroj (xix, 751 p.) : |b ill. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a počítač |b c |2 rdamedia | ||
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| 490 | 1 | |a Materials characterization series | |
| 504 | |a Includes bibliographical references and index. | ||
| 520 | |a Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities. | ||
| 505 | 0 | |a Introduction and summaries -- Imaging techniques (Microscopy) -- Electron beam instruments -- Structure determination by diffraction and scattering -- Electron emission spectroscopies -- X-ray emission techniques -- Visible/UV emission, reflection, and absorption -- Vibrational spectroscopies and NMR -- Ion scattering techniques -- Mass and optical spectroscopies -- Neutron and nuclear techniques -- Physical and magnetic properties. | |
| 590 | |a Knovel Library |b ACADEMIC - Electronics & Semiconductors | ||
| 506 | |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity | ||
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| 700 | 1 | |a Brundle, C. R. | |
| 700 | 1 | |a Evans, Charles A. | |
| 700 | 1 | |a Wilson, Shaun. | |
| 776 | 0 | 8 | |i Print version: |t Encyclopedia of materials characterization. |d Boston : Butterworth-Heinemann ; Greenwich, CT : Manning, c1992 |z 0750691689 |
| 830 | 0 | |a Materials characterization series. | |
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