Characterization of semiconductor materials principles and methods
Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, and Ion/Solid Interactions.
Saved in:
| Other Authors | |
|---|---|
| Format | Electronic eBook |
| Language | English |
| Published |
Park Ridge, N.J. :
Noyes Publications,
©1989-
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| Series | Materials science and process technology series.
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| Subjects | |
| Online Access | Full text |
| ISBN | 9781591240273 9780815516347 9780815512004 |
| Physical Description | 1 online zdroj (volumes <1>) : illustrations. |
Cover
| Summary: | Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, and Ion/Solid Interactions. |
|---|---|
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 9781591240273 9780815516347 9780815512004 |
| Access: | Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity |
| Physical Description: | 1 online zdroj (volumes <1>) : illustrations. |