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070802s2007 ne s 000 0 eng d |
| 020 |
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|a 9780123739735
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| 035 |
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|a (OCoLC)850832238
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| 040 |
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|a SzZUIDS
|b ger
|c CHVBK
|d OCLCO
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|a System-on-chip test architectures
|h [elektronický zdroj] :
|b nanometer design for testability /
|c ed. by Laung-Terng Wang ... [et al.].
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| 260 |
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|a Amsterdam :
|b Elsevier,
|c 2007.
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| 300 |
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|a 1 online zdroj.
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| 490 |
0 |
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|a Systems on silicon
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| 504 |
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|a Includes bibliographical references and index.
|
| 590 |
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|a Knovel Library
|b ACADEMIC - Computer Hardware Engineering
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| 506 |
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|a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity
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| 650 |
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|a Systems on a chip
|x Testing.
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| 650 |
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|a Integrated circuits
|x Very large scale integration
|x Testing.
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| 650 |
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|a Integrated circuits
|x Very large scale integration
|x Design.
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| 655 |
|
7 |
|a elektronické knihy
|7 fd186907
|2 czenas
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| 655 |
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|a electronic books
|2 eczenas
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| 700 |
1 |
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|a Wang, Laung-Terng.
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| 856 |
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|u https://proxy.k.utb.cz/login?url=http://app.knovel.com/hotlink/toc/id:kpSCTANDT1/systemonchip_test_architectures__nanometer_design_for_testability
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|c KNOVEL
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|x NEPOSILAT
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