Staff View: System-on-chip test architectures

System-on-chip test architectures nanometer design for testability

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Bibliographic Details
Other Authors:	Wang, Laung-Terng.
Format:	eBook
Language:	English
Published:	Amsterdam : Elsevier, 2007.
Series:	Systems on silicon
Subjects:	Systems on a chip > Testing. Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Design. elektronické knihy electronic books
ISBN:	9780123739735
Physical Description:	1 online zdroj.


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245	0	0	\|a System-on-chip test architectures \|h [elektronický zdroj] : \|b nanometer design for testability / \|c ed. by Laung-Terng Wang ... [et al.].
260			\|a Amsterdam : \|b Elsevier, \|c 2007.
300			\|a 1 online zdroj.
490	0		\|a Systems on silicon
504			\|a Includes bibliographical references and index.
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