Reliability of MEMS : testing of materials and devices

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Bibliographic Details
Other Authors: Tabata, Osamu, 1956- (Editor), Tsuchiya, Toshiyuki (Editor)
Format: Book
Language: English
Published: Weinheim : Wiley-VCH, [2013]
Edition: [New edition]
Series: Advanced micro & nanosystems
Subjects:
ISBN: 9783527335015
978-3-527-67503-6
Physical Description: xx, 303 stran : černobílé ilustrace ; 25 cm

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Bibliography: Obsahuje bibliografické odkazy a rejstřík
ISBN: 9783527335015
978-3-527-67503-6