Scanning probe microscopy in industrial applications : nanomechanical characterization

"Covering a diverse range of practical applications and real-world examples, Scanning Probe Microscopy for Industrial Applications examines important and successful applications of SPM in various industries, including food science, personal care industry, and forestry applications. Author D. G....

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Bibliographic Details
Main Author Yablon, Dalia G., 1975- (Author, Editor)
Format Book
LanguageEnglish
Published Hoboken, New Jersey : Wiley, c2014
Subjects
Online AccessObálka
ISBN9781118288238
Physical Descriptionxix, 347 s., [16] s. obr. příl. : il. (některé barev.) ; 25 cm

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Table of Contents:
  • Preface and Acknowledgements Chapter 1 Overview of Atomic Force Microscopy Chapter 2 Understanding the tip-sample contact: an overview of contact mechanics from the macro to the nanoscale Chapter 3: understanding surface forces using static and dynamic approach/retraction curves Chapter 4: Phase Imaging Chapter 5: Dynamic contact AFM methods for nanomechanical properties Chapter 6: Best Practices in AFM Imaging Chapter 7: Nanoindentation measurements of Mechanical properties of very thin films and nanostructured materials at high spatial resolution Chapter 8: SPM for Critical Measurements in the Semiconductor Industry Chapter 9: SPM for Polymer Applications in the Chemicals Industry Chapter 10: Unravelling links between food structure and function with probe microscopy Chapter 11: Microcantilever Sensors For Petrochemical Applications Chapter 12: Applications of SPM in cosmetic Science Chapter 13: Applications of Scanning Probe Microscopy and Nanomechanical Analysis in Pharmaceutical Development Chapter 14: A comparative nanomechanical study of multiharmonic force microscopy and nanoindentation on low dielectric constant materials Chapter 15: Nanomechanical Characterization of Biomaterial Surfaces: polymer coatings that elute drugs