RF and microwave modeling and measurement techniques for field effect transistors

• Main Author: Gao, Jianjun, 1968-
• Corporate Author: Knovel (Firm)
• Format: eBook
• Language: English
• Published: Raleigh, NC : SciTech Pub., c2010.
• Subjects: Field-effect transistors > Testing.; Compound semiconductors > Testing.; Field-effect transistors > Mathematical models.; Compound semiconductors > Mathematical models.; Microwave measurements.; Radio measurements.; elektronické knihy; electronic books
• ISBN: 9781613442869; 9781613530900
• Physical Description: 1 online zdroj (x, 339 p.) : ill.

"This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, red...

Table of Contents:

• Representation of Microwave Two-Port Network
• Microwave and RF Measurement Techniques
• FET Small Signal Modeling and Parameter Extraction
• FET Nonlinear Modeling and Parameter Extraction
• Microwave Noise Modeling and Parameter Extraction Technique for FETs
• Artificial Neural Network Modeling Technique for FET