RF and microwave modeling and measurement techniques for field effect transistors

"This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, red...

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Bibliographic Details
Main Author: Gao, Jianjun, 1968-
Corporate Author: Knovel (Firm)
Format: eBook
Language: English
Published: Raleigh, NC : SciTech Pub., c2010.
Subjects:
Field-effect transistors > Testing.
Compound semiconductors > Testing.
Field-effect transistors > Mathematical models.
Compound semiconductors > Mathematical models.
Microwave measurements.
Radio measurements.
elektronické knihy
electronic books
ISBN: 9781613442869
9781613530900
Physical Description: 1 online zdroj (x, 339 p.) : ill.

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Table of contents

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020 |a 9781613442869  |q (ebook) 
020 |a 9781613530900  |q (ebook) 
035 |a (OCoLC)760985227  |z (OCoLC)842936688 
040 |a KNOVL  |c KNOVL  |d VLB  |d COO  |d DEBSZ  |d ZCU  |d OCLCQ  |d N$T  |d YDXCP  |d IDEBK  |d E7B  |d KNOVL 
100 1 |a Gao, Jianjun,  |d 1968- 
245 1 0 |a RF and microwave modeling and measurement techniques for field effect transistors  |h [elektronický zdroj] /  |c Jianjun Gao. 
260 |a Raleigh, NC :  |b SciTech Pub.,  |c c2010. 
300 |a 1 online zdroj (x, 339 p.) :  |b ill. 
504 |a Includes bibliographical references and index. 
505 0 |a Representation of Microwave Two-Port Network -- Microwave and RF Measurement Techniques -- FET Small Signal Modeling and Parameter Extraction -- FET Nonlinear Modeling and Parameter Extraction -- Microwave Noise Modeling and Parameter Extraction Technique for FETs -- Artificial Neural Network Modeling Technique for FET 
520 |a "This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success. 
520 |a The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such as: small signal, large signal, noise, and the artificial neural network based."--pub. desc. 
588 |a Description based on print version record. 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity 
650 0 |a Field-effect transistors  |x Testing. 
650 0 |a Compound semiconductors  |x Testing. 
650 0 |a Field-effect transistors  |x Mathematical models. 
650 0 |a Compound semiconductors  |x Mathematical models. 
650 0 |a Microwave measurements. 
650 0 |a Radio measurements. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
710 2 |a Knovel (Firm) 
776 0 8 |i Print version:  |a Gao, Jianjun, 1968-  |t RF and microwave modeling and measurement techniques for field effect transistors.  |d Raleigh, NC : SciTech Pub., c2010  |z 9781891121890  |w (DLC) 2009017804  |w (OCoLC)320621684 
856 4 0 |u https://proxy.k.utb.cz/login?url=http://app.knovel.com/web/toc.v/cid:kpRFMMMTCH  |y Plný text 
992 |a BK  |c KNOVEL 
999 |c 73864  |d 73864 

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