Reliability and radiation effects in compound semiconductors

This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first...

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Bibliographic Details
Main Author: Johnston, Allan
Format: eBook
Language: English
Published: Singapore ; Hackensack, NJ : World Scientific, c2010.
Subjects:
Compound semiconductors > Reliability.
Compound semiconductors > Effect of radiation on.
elektronické knihy
electronic books
ISBN: 9781615836871
Physical Description: 1 online zdroj (xii, 363 p.) : ill.

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035 |a (OCoLC)701731809  |z (OCoLC)738434092 
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100 1 |a Johnston, Allan  |q (Allan H.) 
245 1 0 |a Reliability and radiation effects in compound semiconductors  |h [elektronický zdroj] /  |c Allan Johnston. 
260 |a Singapore ;  |a Hackensack, NJ :  |b World Scientific,  |c c2010. 
300 |a 1 online zdroj (xii, 363 p.) :  |b ill. 
504 |a Includes bibliographical references (p. 356) and index. 
505 0 |a Semiconductor fundamentals -- Transistor technologies -- Optoelectronics -- Reliability fundamentals -- Compound semiconductor reliability -- Optoelectronic device reliability -- Radiation environments -- Interactions of radiation with semiconductors -- Displacement damage in compound semiconductors -- Displacement damage in optoelectronic devices -- Radiation damage in optocouplers -- Effects from single particles. 
520 |a This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates. 
588 |a Description based on print version record. 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty univerzity 
650 0 |a Compound semiconductors  |x Reliability. 
650 0 |a Compound semiconductors  |x Effect of radiation on. 
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655 9 |a electronic books  |2 eczenas 
776 0 8 |i Print version:  |a Johnston, Allan (Allan H.).  |t Reliability and radiation effects in compound semiconductors.  |d Singapore ; Hackensack, NJ : World Scientific, c2010  |z 9789814277105  |w (OCoLC)311763222 
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