Amplitude modulation atomic force microscopy

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Bibliographic Details
Main Author García, Ricardo (Author)
Corporate Author John Wiley & Sons
Format Electronic eBook
LanguageEnglish
Published Weinheim : Wiley-VCH, [2010]
Subjects
Online AccessFull text
ISBN9783527632183
978-3-527-40834-4
Physical Description1 online zdroj (xiv, 179 stran) : ilustrace

Cover

Table of Contents:
  • Front Matter
  • Introduction
  • Instrumental and Conceptual Aspects
  • Tip-Surface Interaction Forces
  • Theory of Amplitude Modulation AFM
  • Advanced Theory of Amplitude Modulation AFM
  • Amplitude Modulation AFM in Liquid
  • Phase Imaging Atomic Force Microscopy
  • Resolution, Noise, and Sensitivity
  • Multifrequency Atomic Force Microscopy
  • Beyond Topographic Imaging
  • References
  • Index