Lab VIEW run four point probe device : electrical characterization of semiconducting thin films made easy by four point probe system controlled by LabVIEW - Agumba, John; Karimi, Patrick; Okumu, John (LAP LAMBERT Academic Publishing, 2012)
Terminologický slovník
Keywords: fyzika tenkých vrstev; tenké vrstvy; polovodiče; elektrická vodivost; elektrické vlastnosti materiálů; zkoušení materiálů; automatizované měřicí systémy; physics of thin layers; thin films; semiconductors; electric conductivity; electric properties of materials; material testing; automated measuring systems; LabView; studie; studies