Atomic force microscopy in process engineering : an introduction to AFM for improved processes and products - Bowen, W. Richard; Hilal, Nidal (Butterworth-Heinemann, 2009)
Keywords: mikroskopie atomárních sil; skenovací mikroskopie; mikroskopické zkoumání materiálů; atomic force microscopy; scanning probe microscopy; microscopic examination of materials; kolektivní monografie; collective monographs