Staff View: Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits

Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits

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Bibliographic Details
Main Authors:	Bushnell, Michael L. 1950- (Author), Agrawal, Vishwani D., 1943- (Author)
Format:	Book
Language:	English
Published:	Boston : Kluwer, c2000
Series:	Frontiers in electronic testing
Subjects:	testování elektronických systémů VLSI učebnice
ISBN:	0792379918
Physical Description:	xviii, 690 s. : il.


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