Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits

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Bibliographic Details
Main Authors: Bushnell, Michael L. 1950- (Author), Agrawal, Vishwani D., 1943- (Author)
Format: Book
Language: English
Published: Boston : Kluwer, c2000
Series: Frontiers in electronic testing
Subjects:
ISBN: 0792379918
Physical Description: xviii, 690 s. : il.

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Bibliography: Obsahuje bibliografii a rejstřík
ISBN: 0792379918