Electrically Based Microstructural Characterization : Symposium held December 1-4, 1997, Boston. Vol. 2. /
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| Corporate Author | |
|---|---|
| Other Authors | , , |
| Format | Book |
| Language | English |
| Published |
Warrendale :
Materials Research Society,
1998
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| Series | Materials Research Society Symposium Proceedings
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| Subjects | |
| ISBN | 155899405X |
| Physical Description | 367 s. |
Cover
| ISBN: | 155899405X |
|---|---|
| Physical Description: | 367 s. |