Electrically Based Microstructural Characterization : Symposium held December 1-4, 1997, Boston. Vol. 2. /
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Corporate Author: | |
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Other Authors: | , , |
Format: | Book |
Language: | English |
Published: |
Warrendale :
Materials Research Society,
1998
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Series: | Materials Research Society Symposium Proceedings
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Subjects: | |
ISBN: | 155899405X |
Physical Description: | 367 s. |
ISBN: | 155899405X |
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