rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Structural and Chemical Analysis of Materials
    sub title: X-ray, electron and neutron diffraction. X-ray, electron and ion spectrometry. Electron microscopy
  name:
    name part: Eberhart, Jean-Pierre
    role:
      role term: creator
    role:
      role term: aut
  type of resource: text
  origin info:
    place:
      place term: xxu
    place:
      place term: Chichester
    publisher: John Wiley & Sons
    date issued: 1995
    issuance: monographic
  language:
    language term: eng
  physical description:
    extent: 545 s.
  subject:
    topic: chemická analýza
  subject:
    topic: difrakce
  subject:
    topic: elektronová mikroskopie
  subject:
    topic: elektrony
  subject:
    topic: ionty
  subject:
    topic: materiály
  subject:
    topic: neutrony
  subject:
    topic: rentgenová difrakce
  subject:
    topic: rentgenová spektroskopie
  subject:
    topic: spektrometrie
  subject:
    topic: struktura
  classification: 543
  identifier: 0471950149
  record info:
    record content source: ZLD002
    record creation date: 990713
    record change date: 20220825155445.0
    record identifier: 16547
    language of cataloging:
      language term: cze