Nanometer CMOS ICs : from basics to ASICs

This textbook provides a comprehensive, fully-updated introduction to the essentials of nanometer CMOS integrated circuits. It includes aspects of scaling to even beyond 12nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substantial insigh...

Full description

Saved in:
Bibliographic Details
Main Author: Veendrick, H. J. M. (Author)
Format: eBook
Language: English
Published: Cham : Springer, 2017.
Edition: Second edition.
Subjects:
ISBN: 9783319475974
9783319475950
Physical Description: 1 online resource (xxxvii, 595 pages) : illustrations (some color)

Cover

Table of contents

LEADER 03362cam a2200397Ii 4500
001 100062
003 CZ-ZlUTB
005 20201229193817.0
006 m o d
007 cr cn|||||||||
008 170505s2017 sz a ob 001 0 eng d
040 |a LGG  |b eng  |e rda  |e pn  |c LGG  |d GW5XE  |d YDX  |d UAB  |d ESU  |d OCLCF  |d NJR  |d COO  |d OTZ  |d IOG  |d U3W  |d CAUOI  |d OCLCQ  |d KSU  |d NLE  |d EBLCP  |d WYU  |d OCLCQ  |d UKAHL 
020 |a 9783319475974  |q (electronic bk.) 
020 |z 9783319475950  |q (print) 
035 |a (OCoLC)985626536  |z (OCoLC)985636514  |z (OCoLC)985955536  |z (OCoLC)986027821  |z (OCoLC)986395160  |z (OCoLC)986760023  |z (OCoLC)986868001 
100 1 |a Veendrick, H. J. M.  |q (Harry J. M.),  |e author. 
245 1 0 |a Nanometer CMOS ICs :  |b from basics to ASICs /  |c Harry J.M. Veendrick. 
250 |a Second edition. 
264 1 |a Cham :  |b Springer,  |c 2017. 
300 |a 1 online resource (xxxvii, 595 pages) :  |b illustrations (some color) 
336 |a text  |b txt  |2 rdacontent 
337 |a počítač  |b c  |2 rdamedia 
338 |a online zdroj  |b cr  |2 rdacarrier 
504 |a Includes bibliographical references and index. 
505 0 |a Basic Principles -- Geometrical-, Physical- and Field-Scaling Impact on MOS Transistor Behavior -- Manufacture of MOS Devices -- CMOS Circuits -- Special Circuits, Devices and Technologies -- Memories -- Very Large Scale Integration (VLSI) and ASICs -- Low Power, a Hot Topic in IC Design -- Robustness of Nanometer CMOS Designs: Signal Integrity, Variability and Reliability -- Testing, Yield, Packaging, Debug and Failure Analysis -- Effects of Scaling on MOS IC Design and Consequences for the Roadmap. 
506 |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty 
520 |a This textbook provides a comprehensive, fully-updated introduction to the essentials of nanometer CMOS integrated circuits. It includes aspects of scaling to even beyond 12nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substantial insight into the various aspects of design implementation and application. Coverage includes all associated disciplines of nanometer CMOS ICs, including physics, lithography, technology, design, memories, VLSI, power consumption, variability, reliability and signal integrity, testing, yield, failure analysis, packaging, scaling trends and road blocks. The text is based upon in-house Philips, NXP Semiconductors, Applied Materials, ASML, IMEC, ST-Ericsson, TSMC, etc., courseware, which, to date, has been completed by more than 4500 engineers working in a large variety of related disciplines: architecture, design, test, fabrication process, packaging, failure analysis and software. 
590 |a SpringerLink  |b Springer Complete eBooks 
650 0 |a Metal oxide semiconductors, Complementary. 
650 0 |a Application-specific integrated circuits. 
655 7 |a elektronické knihy  |7 fd186907  |2 czenas 
655 9 |a electronic books  |2 eczenas 
776 0 8 |i Print version:  |a Veendrick, H.J.M. (Harry J.M.).  |t Nanometer CMOS ICs.  |b Second edition.  |d Cham : Springer, 2017  |z 3319475959  |z 9783319475950  |w (OCoLC)958355028 
856 4 0 |u https://proxy.k.utb.cz/login?url=https://link.springer.com/10.1007/978-3-319-47597-4  |y Plný text 
992 |c NTK-SpringerENG 
999 |c 100062  |d 100062