Nanometer CMOS ICs : from basics to ASICs
This textbook provides a comprehensive, fully-updated introduction to the essentials of nanometer CMOS integrated circuits. It includes aspects of scaling to even beyond 12nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substantial insigh...
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Main Author: | |
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Format: | eBook |
Language: | English |
Published: |
Cham :
Springer,
2017.
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Edition: | Second edition. |
Subjects: | |
ISBN: | 9783319475974 9783319475950 |
Physical Description: | 1 online resource (xxxvii, 595 pages) : illustrations (some color) |
LEADER | 03393cam a2200409Ii 4500 | ||
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100 | 1 | |a Veendrick, H. J. M. |q (Harry J. M.), |e author. | |
245 | 1 | 0 | |a Nanometer CMOS ICs : |b from basics to ASICs / |c Harry J.M. Veendrick. |
250 | |a Second edition. | ||
264 | 1 | |a Cham : |b Springer, |c 2017. | |
300 | |a 1 online resource (xxxvii, 595 pages) : |b illustrations (some color) | ||
336 | |a text |b txt |2 rdacontent | ||
337 | |a počítač |b c |2 rdamedia | ||
338 | |a online zdroj |b cr |2 rdacarrier | ||
504 | |a Includes bibliographical references and index. | ||
505 | 0 | |a Basic Principles -- Geometrical-, Physical- and Field-Scaling Impact on MOS Transistor Behavior -- Manufacture of MOS Devices -- CMOS Circuits -- Special Circuits, Devices and Technologies -- Memories -- Very Large Scale Integration (VLSI) and ASICs -- Low Power, a Hot Topic in IC Design -- Robustness of Nanometer CMOS Designs: Signal Integrity, Variability and Reliability -- Testing, Yield, Packaging, Debug and Failure Analysis -- Effects of Scaling on MOS IC Design and Consequences for the Roadmap. | |
506 | |a Plný text je dostupný pouze z IP adres počítačů Univerzity Tomáše Bati ve Zlíně nebo vzdáleným přístupem pro zaměstnance a studenty | ||
520 | |a This textbook provides a comprehensive, fully-updated introduction to the essentials of nanometer CMOS integrated circuits. It includes aspects of scaling to even beyond 12nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substantial insight into the various aspects of design implementation and application. Coverage includes all associated disciplines of nanometer CMOS ICs, including physics, lithography, technology, design, memories, VLSI, power consumption, variability, reliability and signal integrity, testing, yield, failure analysis, packaging, scaling trends and road blocks. The text is based upon in-house Philips, NXP Semiconductors, Applied Materials, ASML, IMEC, ST-Ericsson, TSMC, etc., courseware, which, to date, has been completed by more than 4500 engineers working in a large variety of related disciplines: architecture, design, test, fabrication process, packaging, failure analysis and software. | ||
590 | |a SpringerLink |b Springer Complete eBooks | ||
650 | 0 | |a Metal oxide semiconductors, Complementary. | |
650 | 0 | |a Application-specific integrated circuits. | |
655 | 7 | |a elektronické knihy |7 fd186907 |2 czenas | |
655 | 9 | |a electronic books |2 eczenas | |
776 | 0 | 8 | |i Print version: |a Veendrick, H.J.M. (Harry J.M.). |t Nanometer CMOS ICs. |b Second edition. |d Cham : Springer, 2017 |z 3319475959 |z 9783319475950 |w (OCoLC)958355028 |
856 | 4 | 0 | |u https://proxy.k.utb.cz/login?url=https://link.springer.com/10.1007/978-3-319-47597-4 |y Plný text |
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