Xiaoqing Wen
}}Xiaoqing Wen from the Kyushu Institute of Technology, Iizuka, Fukuoka, Japan was named Fellow of the Institute of Electrical and Electronics Engineers (IEEE) in 2012 ''for contributions to testing of integrated circuits''. Provided by Wikipedia
VLSI test principles and architectures design for testability
Year of Publication 2006
Full text
Electronic
eBook
VLSI test principles and architectures : design for testability
Year of Publication 2006
Full text
Electronic
eBook